Course syllabus

Course-PM

TIF340 / FYM340 Advanced materials imaging and microanalysis lp1 HT20 (7.5 hp)

Course is offered by the department of Physics

Contact details

Examiner: Lena Falk (lklfalk@chalmers.se)

Lecturers: Lena Falk (lklfalk@chalmers.se), Mats Halvarsson (mats.halvarsson@chalmers.se)

Lab supervisors:

Course purpose

The purpose of this course is to provide a basic knowledge of the physics behind modern imaging and microanalytical techniques based on the interaction of a probe of energetic electrons or ions with matter, and to develop an understanding of how different signals generated in these processes may be interpreted in terms of a material's structure at the atomic, nano and macro scales. The course will also give some practical experience of up-to-date instrumentation utilizing the techniques in imaging and microanalysis that are discussed.  The techniques discussed in the course are powerful tools that are widely used in materials research and development in both industry and academia.  The course provides a basis for specialised courses in, for example, experimental physics, materials physics and anaoscience.

Schedule

TimeEdit

Course literature

Selected chapters in the following two ebooks available at Chalmers Library (http://www.lib.chalmers.se/soek/om-e-boecker/):

1.  Transmission Electron Microscopy [electronic resource]: A textbook for Materials Science by David B. Williams, C. Barry Carter. Springer eBooks, New York, NY: Springer US: Imprint: Springer, 2009, 2nd ed. 2009.

2.  Scanning Electron Microscopy and X-Ray Microanalysis [electronic resource] by Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy. Springer eBooks, New York, NY: Springer New York: Imprint Springer, 2018 4th ed. 2018.

Course design

The course comprises 14 lectures, four tutorials and two compulsory laboratory sessions.

Changes made since the last occasion

A summary of changes made since the last occasion.

Learning objectives and syllabus

Learning objectives:

After completion of this course the student should be able to discuss the physics behind image formation, diffraction and microanalysis based on electron interaction with mattter.  The student should also be able to discuss critical aspects of modern electron and ion imaging and microanalytical techniques in terms of obtained information, resolution, accuracy and sensitivity.  The student will get both theoretical and practical experience of the scanning and transmission electron microscopes (SEM, TEM), focused ion beam instruments (FIB) and microanalytical techniques such as X-ray energy dispersive spectrometry (XEDS) and electron energy loss spectroscopy (EELS).

Content:

Electron interaction with matter; Ion interaction with matter; Image formation using lenses; Electron diffraction; X-ray energy dispersive spectrometry (XEDS); Electron energy loss spectroscopy (EELS); Resolution; Scanning electron microscopy (SEM); Transmission electron microscopy (TEM); Focused ion beam (FIB) instruments.

Link to the syllabus on Studieportalen.

Study plan

If the course is a joint course (Chalmers and Göteborgs Universitet) you should link to both syllabus (Chalmers and Göteborgs Universitet).

Examination form

Written examination.  Two compulsory laboratory sessions.

Chalmers grades: 5, 4, 3, fail

GU grades: VG, G, fail